Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 180 of 241 found articles
 
 
  Reliability study of a microwave Ga As field-effect transistor, by means of factorial analysis and automatic classification methods
 
 
Title: Reliability study of a microwave Ga As field-effect transistor, by means of factorial analysis and automatic classification methods
Author:
Appeared in: Microelectronics reliability
Paging: Volume 24 (1984) nr. 4 pages 1 p.
Year: 1984
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 180 of 241 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands