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                                       Details for article 48 of 143 found articles
 
 
  Effect of the presence of an inversion layer in an MPN structure
 
 
Title: Effect of the presence of an inversion layer in an MPN structure
Author:
Appeared in: Microelectronics reliability
Paging: Volume 23 (1983) nr. 1 pages 1 p.
Year: 1983
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 48 of 143 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands