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                                       Details for article 103 of 177 found articles
 
 
  Model of impurity diffusion from an oxide source into silicon
 
 
Title: Model of impurity diffusion from an oxide source into silicon
Author:
Appeared in: Microelectronics reliability
Paging: Volume 22 (1982) nr. 4 pages 1 p.
Year: 1982
Contents:
Publisher: Pergamon Press Ltd.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 103 of 177 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands