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Journal description
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Details for article 13 of 22 found articles
| Title: |
Modeling total ionizing dose radiation effects in p-type polycrystalline silicon thin film transistors |
| Author: |
Peng, Shaoman Shan, Haoliang Yang, Ruifan Liu, Yuan Deng, Wanling |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 171 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 22 found articles
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