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Details for article 60 of 152 found articles
| Title: |
Influence of interface charge inhomogeneities on the measurement of surface state densities in Si-SiO2 interfaces by means of the MOS a.c. conductance technique |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 17 (1978) nr. 4 pages 2 p. |
| Year: |
1978 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 60 of 152 found articles
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