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Journal description
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Details for article 40 of 63 found articles
| Title: |
Optimization of the drain-side configuration in ESD-protection SCR-LDMOS for high holding-voltage applications |
| Author: |
Zunarelli, L. Rotorato, S. Gnani, E. Reggiani, S. Sankaralingam, R. Dissegna, M. Boselli, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 168 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 63 found articles
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