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Failure modes competition and long-term reliability in the isothermal aging of sintered Cu joints |
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Titel: |
Failure modes competition and long-term reliability in the isothermal aging of sintered Cu joints |
Auteur: |
Xin, Jianbo Lv, Xiaochun Gao, Yue Yang, Le Liu, Sushi Li, Ke Zhou, Minghao Cai, William Zhang, Jing Liu, Yang |
Verschenen in: |
Microelectronics reliability |
Paginering: |
Jaargang 168 () nr. C pagina's p. |
Jaar: |
2025 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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