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Journal description
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Details for article 17 of 63 found articles
| Title: |
ESD Human Body Model step stress distributions of GaN HEMTs and the correlation with one level test results |
| Author: |
van der Berg, R.A. Jellema, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 168 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 63 found articles
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