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Details for article 11 of 63 found articles
| Title: |
Degradation prediction of IGBT module based on CNN-LSTM network |
| Author: |
Bai, Liangjun Huang, Meng Pan, Shangzhi Li, Kang Zha, Xiaoming |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 168 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 63 found articles
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