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Journal description
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Details for article 14 of 14 found articles
| Title: |
Single event effects hardening in SiC double-trench MOSFETs |
| Author: |
Sun, Shuqing Chen, Feida Sun, Yongbo Li, Yongxing Yang, Kun Tang, Xiaobin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 164 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 14 found articles
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