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Journal description
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Details for article 1 of 14 found articles
| Title: |
A study of UIS ruggedness of mismatched paralleled SiC MOSFETs |
| Author: |
Scognamillo, C. Catalano, A.P. Codecasa, L. Castellazzi, A. d'Alessandro, V. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 164 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 14 found articles
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