|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 26 found articles
| Title: |
A SEGR hardened trench gate DMOS with stepped source and optimized LOCOS structure |
| Author: |
Zhang, Yanfei Gong, Xueqin Liu, Mengxin Wen, Xiaoxia Cai, Xiaowu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 162 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 26 found articles
| << previous | next >> |