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Journal description
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Details for article 5 of 19 found articles
| Title: |
A trench beside field limiting rings terminal for improved 4H-SiC junction barrier Schottky diodes: Proposal and investigation |
| Author: |
Ye, Xiaofeng Ke, Huihuang Wei, Shubo Weng, Hongjin Wang, Xinwei Wong, Shen Yuong Yang, Weifeng |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 160 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 19 found articles
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