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Journal description
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Details for article 28 of 157 found articles
| Title: |
A technique for measuring the impurity concentration of silicon-on-sapphire films using C-V plots |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 16 (1977) nr. 1 pages 2 p. |
| Year: |
1977 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 157 found articles
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