|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 27 found articles
| Title: |
A comprehensive analysis of LDMOS transistors for analog applications under γ-radiation |
| Author: |
Routh, Sujay Baruah, Ratul Kumar |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 148 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 27 found articles
| next >> |