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Journal description
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Details for article 2 of 18 found articles
| Title: |
Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices |
| Author: |
Waldhoer, Dominic Schleich, Christian Michl, Jakob Grill, Alexander Claes, Dieter Karl, Alexander Knobloch, Theresia Rzepa, Gerhard Franco, Jacopo Kaczer, Ben Waltl, Michael Grasser, Tibor |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 146 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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