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Journal description
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Details for article 12 of 18 found articles
| Title: |
Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells |
| Author: |
Stellari, Franco Wu, Ernest Y. Ocola, Leonidas E. Ando, Takashi Song, Peilin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 146 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 18 found articles
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