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                                       Details for article 44 of 153 found articles
 
 
  Electrical characteristics of the SiO2-Si interface near midgap and in weak inversion
 
 
Title: Electrical characteristics of the SiO2-Si interface near midgap and in weak inversion
Author:
Appeared in: Microelectronics reliability
Paging: Volume 14 (1975) nr. 1 pages 2 p.
Year: 1975
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 44 of 153 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands