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Journal description
All volumes of the corresponding journal
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Details for article 32 of 52 found articles
| Title: |
Origin of trap assisted tunnelling in ammonia annealed SiC trench MOSFETs |
| Author: |
Berens, Judith Mistry, Manesh V. Waldhör, Dominic Shluger, Alexander Pobegen, Gregor Grasser, Tibor |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 139 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
The Author(s) |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 52 found articles
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