|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 93 of 115 found articles
| Title: |
Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants |
| Author: |
Wang, Yu-Yun Wang, Kuan-Chi Chang, Ting-Yu Ronchi, Nicolò O'Sullivan, Barry Banerjee, Kaustuv van den Bosch, Geert Van Houdt, Jan Wu, Tian-Li |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 93 of 115 found articles
| << previous | next >> |