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Journal description
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Details for article 89 of 115 found articles
| Title: |
Prognosis of LED lumen degradation using Bayesian optimized neural network approach |
| Author: |
Pugalenthi, Karkulali Lim, Sze Li Harry Park, Hyunseok Hussain, Shaista Raghavan, Nagarajan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 89 of 115 found articles
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