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                                       Details for article 8 of 115 found articles
 
 
  Analysis of copper pillar bump interconnects for RF-filters
 
 
Title: Analysis of copper pillar bump interconnects for RF-filters
Author: Eulenkamp, C.
Schober, J.
Feiertag, G.
Appeared in: Microelectronics reliability
Paging: Volume 138 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 115 found articles
 
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