|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 34 of 115 found articles
| Title: |
Dynamic high temperature operating life test methodology for long-term switching reliability of GaN power devices |
| Author: |
Tayyab, Muhammad Farhan Silvestri, Marco Bernardoni, Mirko Basler, Thomas Curatola, Gilberto |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 115 found articles
| << previous | next >> |