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Journal description
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Details for article 3 of 115 found articles
| Title: |
AC stress analysis of trench-based multi-gate transistors in a 40 nm e-NVM technology |
| Author: |
Gay, R. Marca, V. Della Aziza, H. Chiquet, P. Regnier, A. Niel, S. Marzaki, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 115 found articles
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