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Details for article 25 of 27 found articles
| Title: |
Phase field study on the effect of roughness on interfacial intermetallic compounds of micro-solder joints under multifield coupling |
| Author: |
Guo, Hao Zhang, Long Yin, Limeng |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 137 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 27 found articles
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