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Journal description
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Details for article 17 of 27 found articles
| Title: |
Heavy-ion induced gate damage and thermal destruction in double-trench SiC MOSFETs |
| Author: |
Wang, Lihao Jia, Yunpeng Zhou, Xintian Zhao, Yuanfu Wang, Liang Li, Tongde Hu, Dongqing Wu, Yu Deng, Zhonghan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 137 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 27 found articles
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