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Journal description
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Details for article 14 of 27 found articles
| Title: |
Fatigue of copper films subjected to high-strain rate thermo-mechanical pulsing |
| Author: |
Moser, Sebastian Kleinbichler, Manuel Zechner, Johannes Reisinger, Michael Nelhiebel, Michael Cordill, Megan J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 137 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 27 found articles
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