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                                       Details for article 6 of 34 found articles
 
 
  A simulation-based evaluation of single-event burnout mechanisms and varied SEB hardening designs in power LDMOS transistors
 
 
Title: A simulation-based evaluation of single-event burnout mechanisms and varied SEB hardening designs in power LDMOS transistors
Author: Lei, Yibo
Fang, Jian
Zhang, Bo
Appeared in: Microelectronics reliability
Paging: Volume 135 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 34 found articles
 
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