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Journal description
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Details for article 6 of 12 found articles
| Title: |
Demonstration of Schottky barrier diode integrated in 200 V power p-GaN HEMTs technology with robust stability |
| Author: |
Gallardo, Jethro Oroceo Dash, Sachidananda Tran, Thanh Nga Huang, Zhen-Hong Tang, Shun-Wei Wellekens, Dirk Bakeroot, Benoit Syshchyk, Olga De Jaeger, Brice Decoutere, Stefaan Wu, Tian-Li |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 134 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 12 found articles
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