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Journal description
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Details for article 3 of 12 found articles
| Title: |
An improved test methodology for detecting one-case latent damage in inverter circuit under ESD pulses |
| Author: |
Qing, Yihong Han, Aoran Liao, Wenqian Chen, Le Yang, Zihan Du, Feibo Xie, Tiantian Wu, You-Lin Liu, Zhiwei Kaushik, Brajesh Kumar |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 134 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 12 found articles
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