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Journal description
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Details for article 8 of 10 found articles
| Title: |
Ionizing radiation response of bismuth titanate-based metal-ferroelectric-semiconductor (MFS) type capacitor |
| Author: |
Kaymaz, Ahmet |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 133 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 10 found articles
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