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Journal description
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Details for article 3 of 10 found articles
| Title: |
Degradation of 650 V SiC double-trench MOSFETs under repetitive overcurrent switching stress |
| Author: |
Wang, Lihao Jia, Yunpeng Zhou, Xintian Zhao, Yuanfu Hu, Dongqing Wu, Yu Wang, Liang Li, Tongde Deng, Zhonghan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 133 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 10 found articles
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