Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 75 of 96 found articles
 
 
  Relating factory test failure results to field reliability, required field maintenance, and to total life cycle costs
 
 
Title: Relating factory test failure results to field reliability, required field maintenance, and to total life cycle costs
Author:
Appeared in: Microelectronics reliability
Paging: Volume 13 (1974) nr. 2 pages 1 p.
Year: 1974
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 75 of 96 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands