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Journal description
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Details for article 10 of 19 found articles
| Title: |
Heavy-ion induced single event effects and latent damages in SiC power MOSFETs |
| Author: |
Martinella, C. Natzke, P. Alia, R.G. Kadi, Y. Niskanen, K. Rossi, M. Jaatinen, J. Kettunen, H. Tsibizov, A. Grossner, U. Javanainen, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 128 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 19 found articles
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