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Journal description
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Details for article 90 of 111 found articles
| Title: |
Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating |
| Author: |
Moultif, N. Duguay, S. Latry, O. Ndiaye, M. Joubert, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 90 of 111 found articles
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