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                                       Details for article 86 of 111 found articles
 
 
  Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs
 
 
Title: Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs
Author: Danković, D.
Davidović, V.
Golubović, S.
Veljković, S.
Mitrović, N.
Djorić-Veljković, S.
Appeared in: Microelectronics reliability
Paging: Volume 126 () nr. C pages p.
Year: 2021
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 86 of 111 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands