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Details for article 71 of 111 found articles
| Title: |
Modelling of charge injection by multi-photon absorption in GaN-on-Si HEMTs for SEE testing |
| Author: |
Ngom, C. Pouget, V. Zerarka, M. Coccetti, F. Crepel, O. Touboul, A. Matmat, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 71 of 111 found articles
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