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Journal description
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Details for article 44 of 111 found articles
| Title: |
Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology |
| Author: |
Devoge, P. Aziza, H. Lorenzini, P. Julien, F. Marzaki, A. Malherbe, A. Mantelli, M. Cabout, T. Delalleau, J. Haendler, S. Regnier, A. Niel, S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 44 of 111 found articles
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