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Journal description
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Details for article 37 of 111 found articles
| Title: |
Fatigue crack evolution and effect analysis of Ag sintering die-attachment in SiC power devices under power cycling based on phase-field simulation |
| Author: |
Su, Yutai Fu, Guicui Liu, Changqing Liu, Canyu Long, Xu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 37 of 111 found articles
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