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Details for article 29 of 111 found articles
| Title: |
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact |
| Author: |
Bertoncello, Matteo Barbato, Marco Caria, Alessandro Buffolo, Matteo De Santi, Carlo Rampino, Stefano Vogrig, Daniele Meneghesso, Gaudenzio Meneghini, Matteo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 111 found articles
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