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Journal description
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Details for article 109 of 111 found articles
| Title: |
Towards a safe failure mode under short-circuit operation of power SiC MOSFET using optimal gate source voltage depolarization |
| Author: |
Jouha, Wadia Richardeau, Frédéric Azzopardi, Stephane |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 109 of 111 found articles
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