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Details for article 104 of 111 found articles
| Title: |
Study on the high-temperature triggering and holding characteristics of PDSOI SCR devices |
| Author: |
Wang, J.X. Zhao, F.Z. Ni, T. Li, D.L. Gao, L.C. Wang, J.J. Li, X.J. Zeng, C.B. Luo, J.J. Han, Z.S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 104 of 111 found articles
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