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Details for article 22 of 32 found articles
| Title: |
SEE evaluation of ARM M0 cores in a 28 nm FDSOI technology |
| Author: |
Shi, S.-T. Liu, R. Evans, A. Li, X.-T. Zheng, Y.-L. Chen, L. Glorieux, M. Sanchez, A.J. Wong, R. Wen, S.-J. Cunha, J. Guo, G. Ferlet-Cavrois, V. Summerer, L. Entrena, L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 123 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 32 found articles
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