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Journal description
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Details for article 16 of 32 found articles
| Title: |
Influence of ionisation track structure on 20 nm FDSOI transistor |
| Author: |
Zhang, Hao Liu, Hongxia Pan, Ziwen Chen, Shupeng Chen, Ruibo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 123 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 32 found articles
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