|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 32 found articles
| Title: |
Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET |
| Author: |
Bai, Kun Feng, Shiwei Zheng, Xiang He, Xin Pan, Shijie Li, Xuan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 123 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 32 found articles
| << previous | next >> |