|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 76 of 107 found articles
| Title: |
Relating factory test failure results to field reliability, required field maintenance, and to total life cycle costs |
| Author: |
Ryerson, C.M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 12 (1973) nr. 4 pages 28 p. |
| Year: |
1973 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 76 of 107 found articles
| << previous | next >> |