Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 30 of 107 found articles
 
 
  Elastic constants and raman frequencies of heavily doped Si under uniaxial stress
 
 
Title: Elastic constants and raman frequencies of heavily doped Si under uniaxial stress
Author:
Appeared in: Microelectronics reliability
Paging: Volume 12 (1973) nr. 4 pages 1 p.
Year: 1973
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 30 of 107 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands