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Journal description
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Details for article 9 of 13 found articles
| Title: |
Ruggedness of Dual-GCT against dynamic avalanche and surge current |
| Author: |
Yang, Wuhua Wang, Cailin Yang, Jing Zhang, Qi Su, Le |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 118 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 13 found articles
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