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Journal description
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Details for article 11 of 14 found articles
| Title: |
Single Event Effects in 0.18 μm Pinned Photodiode CMOS Image Sensors: SEU and SEFI |
| Author: |
Cai, Yu long Guo, Qi Wen, Lin Zhou, Dong Feng, Jie Liu, Bing kai Fu, Jing Li, Yu Dong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 117 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 14 found articles
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