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                                       Details for article 16 of 21 found articles
 
 
  Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
 
 
Title: Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
Author: Shu, Lei
Qi, Chun-Hua
Galloway, Kenneth F.
Zhao, Yuan-Fu
Cao, Wei-Yi
Li, Xin-Jian
Wang, Liang
Zhang, En-Xia
Wang, Xin-Sheng
Shi, Rui-Xin
Zhou, Xin
Chen, Wei-Ping
Qiao, Ming
Zhou, Bin
Liu, Chao-Ming
Ma, Liang
Zhang, Yan Qing
Wang, Tian-Qi
Appeared in: Microelectronics reliability
Paging: Volume 116 () nr. C pages p.
Year: 2021
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 21 found articles
 
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