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Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser |
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Title: |
Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser |
Author: |
Shu, Lei Qi, Chun-Hua Galloway, Kenneth F. Zhao, Yuan-Fu Cao, Wei-Yi Li, Xin-Jian Wang, Liang Zhang, En-Xia Wang, Xin-Sheng Shi, Rui-Xin Zhou, Xin Chen, Wei-Ping Qiao, Ming Zhou, Bin Liu, Chao-Ming Ma, Liang Zhang, Yan Qing Wang, Tian-Qi |
Appeared in: |
Microelectronics reliability |
Paging: |
Volume 116 () nr. C pages p. |
Year: |
2021 |
Contents: |
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Publisher: |
Elsevier Ltd |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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